Title of article
Acid colloidal silica slurry for Cu CMP
Author/Authors
Kim، Nam Hoon نويسنده , , Chang، Eui-Goo نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
-25
From page
26
To page
0
Abstract
Semi-abrasive free slurry for copper chemical mechanical planarisation (CMP) with below 0.5% acid colloidal silica provides good hydrogen peroxide stability, excellent colloidal silica dispersion ability and easiness of post-CMP cleaning. This approach may be useful for the application of singleand first-step copper CMP slurry with one package system.
Keywords
Hydrograph
Journal title
IEE Electronics Letters
Serial Year
2004
Journal title
IEE Electronics Letters
Record number
106967
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