Author/Authors :
I.، Adesida, نويسنده , , J.H.، Jang, نويسنده , , S.، Kim, نويسنده ,
Abstract :
Ohmic contacts based on Ir/Au and Pd/Ir/Au metallisations have been formed on highly doped p-type InGaAs. Their electrical characteristics were measured and compared with those of conventional Ti/Pt/Au ohmic contacts. They were found to have ohmic contact resistance as low as Ti/Pt/Au metallisation but with superior thermal stabilities.