Title of article :
Method for measuring source resistance R/sub s/ in saturation region of GaN HEMT device over bias conditions (V/sub gs/,V/sub ds/)
Author/Authors :
C.H.، Oxley, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
-343
From page :
344
To page :
0
Abstract :
To accurately model distortion effects using a large signal model the variation of all the elements of the equivalent circuit model under bias conditions are required. A technique is presented to extract the source resistance R/sub s/ under bias conditions for the aluminium gallium nitride/gallium nitride (AlGaN/GaN) HEMT. The source resistance R/sub s/ is found to decrease as V/sub gs/ is increased, implying that the conduction channel becomes wider, which indicates a parallel conduction path to the 2D electron-gas.
Keywords :
Hydrograph
Journal title :
IEE Electronics Letters
Serial Year :
2004
Journal title :
IEE Electronics Letters
Record number :
107174
Link To Document :
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