Author/Authors :
M.J.، Lee, نويسنده , , E.، Rodriguez-Villegas, نويسنده , , A.، Rankov, نويسنده ,
Abstract :
Because of no general noise model in poly-Si TFT technologies, a noise analysis of poly-Si TFT circuits is currently unavailable in any circuit simulator. Therefore it is shown how to make use of the SpectreHDL language for this purpose once the device noise model is extracted from measurement results.
