Title of article
Ultrafast CMOS inverter with 4.7 ps gate delay fabricated on 90 nm SOI technology
Author/Authors
H.، Jackel, نويسنده , , F.، Ellinger, نويسنده , , L.C.، Rodoni, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
-1250
From page
1251
To page
0
Abstract
Very low gate delays of 7.7 ps at 1 V supply and 4.7 ps at 2 V supply have been achieved for CMOS inverters fabricated on a 90 nm silicon on insulator technology. The results are measured with an optimised CMOS ring oscillator. These are believed to be the lowest gate delays reported to date for CMOS inverters at room temperature.
Keywords
Hydrograph
Journal title
IEE Electronics Letters
Serial Year
2004
Journal title
IEE Electronics Letters
Record number
107768
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