Title of article :
Micro and macroscale tribological behavior of epitaxial Ti3SiC2 thin films
Author/Authors :
Jens Emmerlich، نويسنده , , Gert Gassner، نويسنده , , Per Eklund، نويسنده , , Hans H?gberg، نويسنده , , Lars Hultman، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2008
Abstract :
Ti3SiC2(0 0 0 1) thin films prepared by magnetron sputtering were investigated for their response to tribomechanical strain induced during ball-on-disk experiments with 6 mm alumina balls and scratch tests with a 1 μm cono-spherical diamond tip. Normal loads of 100 μN to 0.24 N were applied resulting in a friction coefficient of 0.1 for the low loads. With higher applied normal loads, the friction coefficient increased up to 0.8. Analysis of the wear tracks using atomic force microscopy, scanning electron microscopy, and Raman spectroscopy revealed excessive debris resulting in third-body abrasion and fast wear. The formation of the debris can be explained by the generation of subsurface delamination cracks on basal planes. Subsequent kink formation obstructs the ball movement which results in the removal of the kinked film parts.
Keywords :
friction , atomic force microscopy , Scanning electron microscopy , Ball-on-disk , Ti3SiC2 , MAX phase