Title of article
Reduced dimensionality in different forms of carbon Original Research Article
Author/Authors
G. Van Tendeloo، نويسنده , , D. Bernaerts، نويسنده , , S. Amelinckx ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
7
From page
487
To page
493
Abstract
Several TEM techniques are used to characterise the local structure of low dimensional forms of carbon. HREM is particularly useful to describe the defect structure of thin films of diamond or fullerenes and C60–C70 nanoclusters. A columnar form of graphite is analysed, mainly by electron diffraction which allowed us to propose a growth mechanism. Diffraction contrast dark field microscopy, in combination with electron diffraction, allows a detailed characterisation of carbon nanotubes; e.g. the chirality distribution of tubes in ropes of single wall tubes is studied by selected area electron diffraction.
Keywords
A. Fullerenes , D. Crystal structure , D. Microstructure , C. Transmission electron microscopy (TEM) , A. Diamond
Journal title
Carbon
Serial Year
1998
Journal title
Carbon
Record number
1117567
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