Texture of PAN- and pitch-based carbon fibers Original Research Article

The new technique of scanning microbeam X-ray diffraction is used to get information about the axial as well as the cross-sectional crystallographic texture of single PAN- and mesophase-pitch-based carbon fibers. The resulting preferred orientation in the axial direction is considerably higher than the values obtained from conventional X-ray diffraction measurements on fiber bundles. A change in azimuthal width of the 002 reflection was observed across some of the fibers, which can be attributed to a radial folded cross-sectional texture for pitch-based fibers, and to a different preferred orientation of skin and core layers for PAN-based fibers.