Author/Authors :
Satoru Suzuki، نويسنده , , Yoshio Watanabe، نويسنده , , Toshio Ogino، نويسنده , , Yoshikazu Homma، نويسنده , , Daisuke Takagi، نويسنده , , Andrea Locatelli and Stefan Heun، نويسنده , , Luca Gregoratti، نويسنده , , Alexei Barinov، نويسنده , , Maya Kiskinova، نويسنده ,
Abstract :
Single-walled carbon nanotube networks grown on SiO2 pillars were studied by means of scanning photoemission microscopy. The individual nanotubes or nanotube bundles growing from the pillar tops were observed in C 1s images. Band bending near catalytic Fe/nanotube contacts in an end-bonded configuration was studied by measuring C 1s spectra along the tube axes. Within our experimental resolution, no band bending was observed. This implies that the depletion width is less than the spatial resolution of the scanning photoemission microscope (90 nm) or that the amount of the band bending is less than 0.1 eV.
Keywords :
A. Carbon nanotubes , B. Chemical vapor deposition , C. x-ray photoelectron spectroscopy , D. electronic properties