Title of article :
Specification for a standard procedure of X-ray diffraction measurements on carbon materials Original Research Article
Author/Authors :
Norio Iwashita، نويسنده , , Chong Rae Park، نويسنده , , Hiroyuki Fujimoto، نويسنده , , Minoru Shiraishi، نويسنده , , Michio Inagaki، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
In 1963, the 117 Committee of the Japan Society for the Promotion of Sciences (JSPS) specified standard procedures for the determination of lattice constants and crystallite sizes of carbon materials, especially graphitized materials, the so-called “Gakushin” method. In 2002 the 117 Committee started to discuss the revision of the specification in order to accept some modern computing processes, such as automatic step-scanning measurements of diffraction intensities, profile fitting for diffraction lines, etc. In this paper, the English version of the revised specification is presented to the international community of scientists working on carbon materials, and to solicit comments.
Keywords :
B: Graphitization , C: X-ray diffraction , D: Crystal structure