Title of article :
Influence of electric field and emission current on the configuration of nanotubes in carbon nanotube layers Original Research Article
Author/Authors :
N.A. Kiselev، نويسنده , , A.L. Musatov، نويسنده , , E.F. Kukovitskii، نويسنده , , J.L. Hutchison ، نويسنده , , O.M. Zhigalina، نويسنده , , V.V. Artemov، نويسنده , , Yu.V. Grigoriev، نويسنده , , K.R. Izrael’yants، نويسنده , , S.G. L’vov، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
12
From page :
3112
To page :
3123
Abstract :
The influence of applied electric field (Eav) and emission current (IFE) on the configuration of conical layers carbon nanotubes (CLNTs) grown by CVD on the edge of Ni foil has been investigated. TEM profile imaging revealed a high concentration of nanotubes near the foil edge surface, whereas on the nanotube layers’ outer surfaces single, non-oriented nanotubes with open ends free of catalytic particles, were observed. After sufficient electric field application many nanotubes became oriented towards the anode, but one or two of them were found to be always a few microns more extended. In situ SEM investigation showed that below Eav = 3.2–3.9 V/μm, emission was achieved at the expense of originally existing free nanotube ends. Configuration changes began at larger electric fields. On the observed foil edge length (14.6–17.8 μm, with an edge thickness of 200 μm) one or two nanotubes extended towards the anode and probably became the main emitters. Upon further increasing the field to Eav = 5.7–8 V/μm and at an emission current IFE = 2 × 10−5 A these tubes disappeared (or essentially shortened). At Eav = 8 V/μm and higher and at an exposure time up to 40 min, several tens of extended nanotubes appeared, with one or two extended well beyond the others. This nanotube configuration pattern is connected with electrostatic screening between the nanotubes. Our interpretation of the data suggests that in the investigated range of Eav and IFE, a limited number of nanotubes are emitting and these nanotubes are constantly changing as Eav, IFE and exposure time increase.
Keywords :
Chemical vapor deposition , electron microscopy , Field electron emission , Microstructure , Carbon nanotubes
Journal title :
Carbon
Serial Year :
2005
Journal title :
Carbon
Record number :
1121378
Link To Document :
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