Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy Original Research Article
Author/Authors :
P. Nemes-Incze، نويسنده , , Z. Osv?th، نويسنده , , K. Kamaras، نويسنده , , L.P. Bir?، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
8
From page :
1435
To page :
1442
Abstract :
Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon oxide surfaces. It is a convenient tool to quickly determine the thickness
