Author/Authors :
Wei Zhang، نويسنده , , Binshi Xu، نويسنده , , Akihiro Tanaka، نويسنده , , Yoshinori Koga، نويسنده ,
Abstract :
Vertically aligned CNT films were grown on polycrystalline β-SiC wafers by the surface decomposition method. Their frictional behaviours were investigated by AFM at the nanometer scales. Compared with DLC film and silicon wafers, they demonstrate an extre
