Imaging defects and junctions in single-walled carbon nanotubes by voltage-contrast scanning electron microscopy Original Research Article
Author/Authors :
Aravind Vijayaraghavan، نويسنده , , Christoph W. Marquardt، نويسنده , , Simone Dehm، نويسنده , , Frank Hennrich، نويسنده , , Ralph Krupke، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
7
From page :
494
To page :
500
Abstract :
Voltage-contrast scanning electron microscopy is demonstrated as a new technique to locate and characterize defects in single-walled carbon nanotubes. This method images the surface potential along and surrounding a nanotube in device configuration and it
