• Title of article

    First principles study of oxygen defects in silicon Original Research Article

  • Author/Authors

    Young Joo Lee، نويسنده , , R.M Nieminen، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2001
  • Pages
    6
  • From page
    305
  • To page
    310
  • Abstract
    Large scale electronic structure calculations are used to study atomic and electronic structures of oxygen complexes On (1⩽n⩽14) and their migration and isomerization in crystalline silicon. Total energies, atomic geometries, charge states, and ionization levels are investigated for the various types of defects. The thermodynamic and the kinetic behaviours of defects are discussed on the basis of the first principles results. The chain-like structures are energetically more favorable than branched ones. The migration energies of the chain-like structures are 0.3 ∼ 2.3 eV and those of branched ones are 2.3 ∼ 2.5 eV. The activation barriers for the isomerizations between different structures are about 2.3 ∼ 2.5 eV.
  • Journal title
    Computer Physics Communications
  • Serial Year
    2001
  • Journal title
    Computer Physics Communications
  • Record number

    1135807