Title of article :
Progress in scanning probe microscopy Original Research Article
Author/Authors :
H.K. Wickramasinghe، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2000
Pages :
12
From page :
347
To page :
358
Abstract :
In the past decade, the field of microscopy has been revolutionized by the introduction of a range of microscopies—scanning probe microscopes that are capable of measuring physical and chemical properties on the nanoscale. These microscopes—which were stimulated by the scanning tunneling microscope—have had a major impact on the understanding of material surfaces. The development of the key concepts of scanning probe microscopes is reviewed from their early history to current technologies. Some key applications of scanning probe microscopes are presented and the future advances that are likely to come to fruition in the next decade are discussed.
Keywords :
Atomic force microscopy (AFM) , Magnetic force microscopy (MFM) , Probe methods , Scanning tunneling microscopy (STM) , optical microscopy
Journal title :
ACTA Materialia
Serial Year :
2000
Journal title :
ACTA Materialia
Record number :
1139407
Link To Document :
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