• Title of article

    Interfacial thermal resistance in nanocrystalline yttria-stabilized zirconia Original Research Article

  • Author/Authors

    Ho-Soon Yang، نويسنده , , G.-R. Bai، نويسنده , , L.J. Thompson، نويسنده , , J.A Eastman، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2002
  • Pages
    9
  • From page
    2309
  • To page
    2317
  • Abstract
    The grain-size dependent thermal conductivity of nanocrystalline yttria-stabilized zirconia from 6–480K is reported. The thermal conductivity for a grain size of 10 nm is reduced to approximately half that of coarse-grained or single-crystal material at all measured temperatures. A method for determining the interfacial resistance to thermal transport in polycrystalline materials from measurements of grain-size-dependent thermal conductivity is described and applied. The results suggest a new strategy for identifying improved thermal barrier materials by choosing materials with large interfacial thermal resistance and reduced dimensionality or grain size, rather than by focusing on minimization of bulk thermal conductivity alone.
  • Keywords
    Thermal properties , Grain boundaries , Thermal conductivity , Chemical vapor deposition
  • Journal title
    ACTA Materialia
  • Serial Year
    2002
  • Journal title
    ACTA Materialia
  • Record number

    1139901