Title of article
Interfacial thermal resistance in nanocrystalline yttria-stabilized zirconia Original Research Article
Author/Authors
Ho-Soon Yang، نويسنده , , G.-R. Bai، نويسنده , , L.J. Thompson، نويسنده , , J.A Eastman، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2002
Pages
9
From page
2309
To page
2317
Abstract
The grain-size dependent thermal conductivity of nanocrystalline yttria-stabilized zirconia from 6–480K is reported. The thermal conductivity for a grain size of 10 nm is reduced to approximately half that of coarse-grained or single-crystal material at all measured temperatures. A method for determining the interfacial resistance to thermal transport in polycrystalline materials from measurements of grain-size-dependent thermal conductivity is described and applied. The results suggest a new strategy for identifying improved thermal barrier materials by choosing materials with large interfacial thermal resistance and reduced dimensionality or grain size, rather than by focusing on minimization of bulk thermal conductivity alone.
Keywords
Thermal properties , Grain boundaries , Thermal conductivity , Chemical vapor deposition
Journal title
ACTA Materialia
Serial Year
2002
Journal title
ACTA Materialia
Record number
1139901
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