Title of article :
Analysis of the T-peel strength in a Cu/Cr/Polyimide system Original Research Article
Author/Authors :
J.Y. Song، نويسنده , , Jin Yu، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2002
Pages :
10
From page :
3985
To page :
3994
Abstract :
The T-peel strengths were measured using a Cu/Cr/polyimide system under varying metal layer thickness and rf plasma pretreatment conditions. Measured peel strength showed reversed camel back shape against the metal layer thickness, which is quite different from the results of the 90° peel test. Elementary analysis suggests that the T-peel strength variation is a combined outcome of the plastic bending work of the metal and polymer strips, and when the latter were subtracted from the measured peel strength, interfacial fracture energies, quite independent of the metal layer thickness but increasing with the rf plasma power density were procured. Another interesting outcome is that the peel angle, the angle between the unpeeled ligament and the load axis normal, can be actually predicted and is a useful measure of the root curvature and the interfacial fracture energy.
Keywords :
Thin film , Peel test , Interfacial fracture energy
Journal title :
ACTA Materialia
Serial Year :
2002
Journal title :
ACTA Materialia
Record number :
1140027
Link To Document :
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