Title of article :
Tensile behavior of free-standing gold films. Part II. Fine-grained films Original Research Article
Author/Authors :
R.D. Emery، نويسنده , , G.L. Povirk، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2003
Pages :
9
From page :
2079
To page :
2087
Abstract :
The room temperature mechanical behavior of thin gold films (0.2–2.0 μm thickness) was investigated through uniaxial tensile testing. Films were deposited by electron beam and thermal evaporation, under varying conditions, in order to produce films with different microstructures. This particular study concentrated on the behavior of the films with grain sizes of less than about 0.5 μm. The testing showed that these fine-grained films exhibited significant strain rate dependence, in contrast with a previous study of gold films with more coarse grain sizes . The results are discussed in terms of existing theories for rate-dependent metals.
Keywords :
Thin films , Tensile testing , Creep , Grain size , Grain boundary strengthening
Journal title :
ACTA Materialia
Serial Year :
2003
Journal title :
ACTA Materialia
Record number :
1140288
Link To Document :
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