Title of article :
Thickness effect on shape memory behavior of Ti-50.0at.%Ni thin film Original Research Article
Author/Authors :
A Ishida، نويسنده , , M Sato، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2003
Pages :
8
From page :
5571
To page :
5578
Abstract :
The thickness effect on the shape memory behavior of Ti-50.0at.%Ni thin films was investigated. It was found that the transformation strain and residual strain under a constant stress are very sensitive to the film thickness when the thickness is less than the average grain size, 5 μm. Cross-sectional observation showed that these strains are affected by two kinds of constraints from surrounding grains and surface oxide layers. With decreasing thickness, the former effect becomes weak, but the latter effect becomes strong. As a result, the transformation strain and residual strain show a maximum around a thickness of 1–2 μm. In addition, the transformation temperatures were also found to be affected by surface oxidation if the thickness is less than 1 μm.
Keywords :
Sputtering , Shape memory alloys (SMA) , Thin films , Martensitic phase transformation , Thickness effect
Journal title :
ACTA Materialia
Serial Year :
2003
Journal title :
ACTA Materialia
Record number :
1140560
Link To Document :
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