Title of article :
Mechanical behaviour of metallic thin films on polymeric substrates and the effect of ion beam assistance on crack propagation Original Research Article
Author/Authors :
M. George، نويسنده , , C. Coupeau، نويسنده , , J. Colin، نويسنده , , J. Colin and J. Grilhé ، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2005
Pages :
7
From page :
411
To page :
417
Abstract :
The mechanisms of crack propagation in metallic films on polymeric substrates have been studied through in situ atomic force microscopy observations of thin films under tensile stresses and finite element stress calculations. Two series of films – ones deposited with ion beam assistance, the others without – have been investigated. The observations and stress calculations show that ion beam assistance can change drastically the propagation of cracks in coated materials: by improving the adhesion film/substrate, it slows down the delamination process, but in the same time enhances the cracks growth in the thickness of the material.
Keywords :
atomic force microscopy , Thin films , Finite element analysis , Mechanical properties
Journal title :
ACTA Materialia
Serial Year :
2005
Journal title :
ACTA Materialia
Record number :
1141190
Link To Document :
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