Title of article :
Effect of substrate compliance on the global unilateral post-buckling of coatings: AFM observations and finite element calculations Original Research Article
Author/Authors :
G. Parry، نويسنده , , J. Colin، نويسنده , , C. Coupeau، نويسنده , , F. Foucher، نويسنده , , A. Cimetière، نويسنده , , J. Colin and J. Grilhé ، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2005
Pages :
7
From page :
441
To page :
447
Abstract :
The post-critical regime of straight-sided wrinkles on compliant substrates of polycarbonate has been observed by atomic force microscope and investigated by means of finite element simulations. The effect of coupling between the film and its substrate has revealed a global buckling phenomenon, characterized by critical loads lower than those found in the case of a rigid substrate. Characteristic shapes of the buckled structure have been also found to spread over a region wider than the delaminated zone itself. A law relating the film deflexion to the stress has finally been established for any film/substrate system.
Keywords :
atomic force microscopy , Thin films , Buckling , Finite element analysis
Journal title :
ACTA Materialia
Serial Year :
2005
Journal title :
ACTA Materialia
Record number :
1141193
Link To Document :
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