Effect of grain size and texture on pseudoelasticity in Cu–Al–Mn-based shape memory wire Original Research Article

The effect of the relative grain size d/D (d: grain size, D: wire diameter) on stress–strain characteristics was investigated in Cu–Al–Mn-based shape memory alloy (SMA) wires. The yield stress (σy), the work-hardening rate after yielding (dσPE/dε) and the stress hysteresis (Δσ) in the wires with a random texture decrease with increasing d/D. The transformation strain (εTS) and the maximum pseudoelastic strain image increase with increasing d/D. The effect of grain size on pseudoelastic behaviors can be clarified from the volume fraction of three-dimensionally constrained grains and the σy, dσPE/dε and Δσ increase proportionally with increasing (1 − (d/D))2 while the εTS decreases proportionally with increasing (1 − (d/D))2. Consequently, the effect of grain size on the pseudoelastic behaviors can be expressed using the Taylor and inverse Schmid factors. The σy and the εTS for wires with a 〈1 1 0〉 fiber texture are larger and smaller than those for wires with a random texture, respectively.