Title of article :
Elastic properties determined from in situ X-ray diffraction Original Research Article
Author/Authors :
A. Cervellino، نويسنده , , P.M. Derlet، نويسنده , , H. Van Swygenhoven، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2006
Pages :
6
From page :
1851
To page :
1856
Abstract :
In situ powder diffraction experiments were performed at the Swiss Light Source MS4 beamline on specimens under tensile deformation. Evaluation of the intensity and position of several Bragg peaks as a function of the applied tensile load allows the average elastic properties of grains as well as of the macroscopic sample to be determined without the necessity of accurate macroscopic strain measurements. The feasibility of the method developed is demonstrated for polycrystalline Si.
Keywords :
Elastic behaviour , Nanostructure , X-ray diffraction
Journal title :
ACTA Materialia
Serial Year :
2006
Journal title :
ACTA Materialia
Record number :
1141826
Link To Document :
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