Title of article :
Lift-off phenomenon in wave soldering Original Research Article
Author/Authors :
K Suganuma، نويسنده , , M Ueshima، نويسنده , , I Ohnaka، نويسنده , , H Yasuda، نويسنده , , J Zhu، نويسنده , , T Matsuda، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2000
Pages :
7
From page :
4475
To page :
4481
Abstract :
The mechanism of lift-off, which is the serious defect formation that the solder fillet is peeled off from a Cu land pad on a printed wiring board in wave soldering, has been examined primarily by using basic Sn–Bi alloys (Sn at 2–5 wt%) and solidification simulation. The probability of lift-off increases with increasing Bi content. Lift-off results from the segregation of Bi, which diffuses in a short distance, in the interfacial region between a Sn–Bi alloy and a Cu land pad during dendritic structure formation. A higher fillet results in a more severe lift-off—the top side of a printed wiring board, where the fillet is low, seldom shows lift-off. The solidification simulation indicates that the solidification of the solder fillet rapidly propagates from a lead wire to a fillet edge. A Cu land acts as a heat sink, with heat flowing from the inner through-hole to the land pad. Both rapid cooling and annealing at high temperature can effectively prevent lift-off.
Keywords :
Lift-off phenomenon , Microstructure , Interface , computer simulation , Segregation
Journal title :
ACTA Materialia
Serial Year :
2000
Journal title :
ACTA Materialia
Record number :
1142008
Link To Document :
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