Title of article
Solid state amorphization in cold drawn Cu/Nb wires Original Research Article
Author/Authors
X Sauvage، نويسنده , , L Renaud، نويسنده , , B. Deconihout، نويسنده , , D Blavette، نويسنده , , D.H. Ping، نويسنده , , K Hono، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2001
Pages
6
From page
389
To page
394
Abstract
The microstructure of cold drawn Cu/Nb nanocomposite wires was investigated using a three dimensional atom probe (3D-AP) and transmission electron microscopy (TEM). Although there is no solubility between Nb and Cu in the equilibrium state, atom probe analysis results revealed that intermixing occurs between Nb and Cu filaments as a result of cold drawing with a large strain. High resolution transmission electron microscopy (HRTEM) results revealed that an amorphous layer is formed along some Cu/Nb interfaces. This solid state amorphization is compared with similar reactions observed in Cu–Nb multilayers.
Keywords
Transmission electron microscopy (TEM) , Cu/Nb nanocomposites , Atom probe , Cold working
Journal title
ACTA Materialia
Serial Year
2001
Journal title
ACTA Materialia
Record number
1142093
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