Title of article :
Study of texture effect on elastic properties of Au thin films by X-ray diffraction and in situ tensile testing Original Research Article
Author/Authors :
D. Faurie، نويسنده , , P.-O. Renault، نويسنده , , E. LE BOURHIS، نويسنده , , Ph. Goudeau، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2006
Pages :
11
From page :
4503
To page :
4513
Abstract :
The influence of texture on the elastic behavior of Au thin films has been quantified experimentally and theoretically. The elastic behaviors of non-textured and {1 1 1} fiber-textured gold thin films were studied by in situ tensile testing using four-circle goniometers on a synchrotron beam line (LURE facility, France). The mechanical coupling of the substrate–thin film composite structure has been described and analytical solutions for diffraction strain analysis have been developed including texture and grain interaction models. These are applied to extract and compare elastic properties of the two types of gold films, and to quantify the effect of texture on the direction-dependent Young’s modulus.
Keywords :
X-ray diffraction (XRD) , Elastic behavior , Texture , Tension test , Thin films
Journal title :
ACTA Materialia
Serial Year :
2006
Journal title :
ACTA Materialia
Record number :
1142628
Link To Document :
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