• Title of article

    Impact of oxygen atmosphere on piezoelectric properties of CaBi2Nb2O9 thin films Original Research Article

  • Author/Authors

    A.Z. Simoes، نويسنده , , C.S. Riccardi، نويسنده , , L.S. Cavalcante، نويسنده , , E. Longo، نويسنده , , J.A. Varela، نويسنده , , B. Mizaikoff، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2007
  • Pages
    6
  • From page
    4707
  • To page
    4712
  • Abstract
    CaBi2Nb2O9 (CBNO) thin films were deposited on platinum-coated silicon substrates by the polymeric precursor method, and were annealed in air and in an oxygen atmosphere. The structure, surface morphology and electrical properties of CBNO thin films have been investigated. The presence of an oxygen atmosphere during crystallization of the films affected the structure perfection and morphology, as well as ferroelectric and piezoelectric properties. A reduction in Pr and piezoelectric coefficient, an increase of Vc and displacement of the Curie point is evident in the films crystallized in an oxygen atmosphere. The impact of exposure to the oxygen atmosphere on the creation of defects caused by bismuth and oxygen vacancies between layers was also investigated by X-ray photoelectron spectroscopy.
  • Keywords
    Vacancies , CaBi2Nb2O9 , X-ray photoelectron spectroscopy , Point defects , Piezoelectricity
  • Journal title
    ACTA Materialia
  • Serial Year
    2007
  • Journal title
    ACTA Materialia
  • Record number

    1143155