Title of article :
Tensile strength of gold nanointerconnects without the influence of strain gradients Original Research Article
Author/Authors :
Sven Olliges، نويسنده , , Patric A. Gruber، نويسنده , , Vaida Auzelyte، نويسنده , , Yasin Ekinci، نويسنده , , Harun H. Solak، نويسنده , , Ralph Spolenak، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2007
Pages :
10
From page :
5201
To page :
5210
Abstract :
Gold is an ideal material for wires and electrodes on the nanoscale because of its corrosion resistance and biocompatibility. For system integration the mechanical properties of gold nanowires are highly important. In this paper, a study on the deformation behavior of parallel line arrays of gold on polyimide substrates is presented. Arrays of 45–60 nm nanolines were produced by extreme ultraviolet interference lithography, evaporation of gold and a subsequent lift-off process. Tensile testing of these samples was performed by using an in situ synchrotron-based technique, which allows for the fast acquisition of diffraction peaks. The samples show yield stresses of about 400 MPa. This is comparable to thin films of similar thickness, but significantly lower than previously reported results on single electrodeposited wires deformed in bending. The differences are explained in terms of strain gradient plasticity theory.
Keywords :
X-ray diffraction , Nanocrystalline materials , Plastic deformation , Tension test , Lithography
Journal title :
ACTA Materialia
Serial Year :
2007
Journal title :
ACTA Materialia
Record number :
1143204
Link To Document :
بازگشت