• Title of article

    Controlled crack arrest in brittle thin films: The effect of embedded voids Original Research Article

  • Author/Authors

    Ling Liu، نويسنده , , Xi Chen، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2008
  • Pages
    10
  • From page
    6214
  • To page
    6223
  • Abstract
    Controlled crack arrest is useful for controlling self-assembled crack paths in micro-fabrication, as well as limiting crack length in toughening composites. Compliant inclusions and voids can effectively attract and arrest cracks, thereby controlling the crack pattern. Analytical stress solution indicates that when the inclusion is about 10 times more compliant than its matrix, it may be effectively modeled as a void. The crack arrest capability is expressed in terms of the critical angle of the initial crack path, as the inclusion size, shape, crack origin and film properties are varied. Simple criteria are established to maximize the crack arrest ability and to determine the critical crack angle. The effectiveness of using different void patterns to arrest cracks is also explored. The results are useful for both controlling and restricting cracks in brittle thin films, through the utilization of compliant or void-like inclusions as crack arrestors.
  • Keywords
    Thin films , Fracture , Toughness , Kinetics self-organization & patterning , simulation
  • Journal title
    ACTA Materialia
  • Serial Year
    2008
  • Journal title
    ACTA Materialia
  • Record number

    1143975