مرکز منطقه ای اطلاع رساني علوم و فناوري - Ex situ structural characterization during the formation of CuInS2 thin films Original Research Article

Title of article :

Ex situ structural characterization during the formation of CuInS2 thin films Original Research Article

Author/Authors :

Chia-Hung Tsai، نويسنده , , Jyh-Ming Ting، نويسنده , , Rui-Ren Wang، نويسنده ,

Issue Information :

دوهفته نامه با شماره پیاپی سال 2011

Pages :

From page :

349

To page :

354

Keywords :

Thin films , TEM , Raman

Journal title :

ACTA Materialia

Serial Year :

2011

Journal title :

ACTA Materialia

Record number :

1145302

Link To Document :