Title of article :
Void growth in copper during high-temperature power-law creep Original Research Article
Author/Authors :
K. Dzieciol، نويسنده , , A. Borbély، نويسنده , , F. Sket، نويسنده , , A. Isaac، نويسنده , , M. Di Michiel، نويسنده , , P. Cloetens، نويسنده , , Th. Buslaps، نويسنده , , A.R. Pyzalla، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2011
Pages :
7
From page :
671
To page :
677
Abstract :
Growth of grain boundary voids during high-temperature power-law creep of metals is usually approximated as the growth of a hole in a nonlinearly viscous solid. Using synchrotron tomography, we show that the functional form of the continuum law is valid but that the real growth rates in copper are higher than the prediction of the viscous model by a factor of about 40. Submicrometer resolution tomography showing faceted void shapes as well as the large scatter of individual growth rates suggest that local dislocation glide has significative contribution to void growth.
Keywords :
Creep test , Void growth , Damage , Synchrotron tomography
Journal title :
ACTA Materialia
Serial Year :
2011
Journal title :
ACTA Materialia
Record number :
1145335
Link To Document :
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