• Title of article

    Void growth in copper during high-temperature power-law creep Original Research Article

  • Author/Authors

    K. Dzieciol، نويسنده , , A. Borbély، نويسنده , , F. Sket، نويسنده , , A. Isaac، نويسنده , , M. Di Michiel، نويسنده , , P. Cloetens، نويسنده , , Th. Buslaps، نويسنده , , A.R. Pyzalla، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2011
  • Pages
    7
  • From page
    671
  • To page
    677
  • Abstract
    Growth of grain boundary voids during high-temperature power-law creep of metals is usually approximated as the growth of a hole in a nonlinearly viscous solid. Using synchrotron tomography, we show that the functional form of the continuum law is valid but that the real growth rates in copper are higher than the prediction of the viscous model by a factor of about 40. Submicrometer resolution tomography showing faceted void shapes as well as the large scatter of individual growth rates suggest that local dislocation glide has significative contribution to void growth.
  • Keywords
    Creep test , Void growth , Damage , Synchrotron tomography
  • Journal title
    ACTA Materialia
  • Serial Year
    2011
  • Journal title
    ACTA Materialia
  • Record number

    1145335