Title of article :
Fabrication of highly dense pure SiC ceramics via the HTPVT method Original Research Article
Author/Authors :
Pei Yun Dai، نويسنده , , Yan Zhong Wang، نويسنده , , Guang Liang Liu، نويسنده , , Bo Wang، نويسنده , , Yong Gui Shi، نويسنده , , Jian Feng Yang، نويسنده , , Guan Jun Qiao، نويسنده , , Hong Jie Wang، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2011
Pages :
7
From page :
6257
To page :
6263
Abstract :
A high-temperature physical vapor transport (HTPVT) method was used to grow highly dense SiC ceramics free of sintering aids, and the effects of growth time and temperature upon the grain size, growth rate, thickness and orientation of silicon carbide were explored. Silicon carbide ceramics with a thickness of 8 mm and a bulk density of 3.208 g/cm−3 were obtained after 4 h of growth. The silicon carbide texture exhibited a preferred orientation along (0 0 0 l) planes. The degree of grain size and orientation of the silicon carbide increased with increased growth time, and the growth rate increased with the growth temperature and temperature gradient. Silicon carbide ceramics exhibited a bending strength of only 290 ± 34 MPa, primarily due to the large grain size (average grain size: 2 mm), and a Vickers hardness of 29.7 ± 0.6 GPa.
Keywords :
Carbides , Recrystallization texture , Grain growth , Ceramics
Journal title :
ACTA Materialia
Serial Year :
2011
Journal title :
ACTA Materialia
Record number :
1145868
Link To Document :
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