Title of article :
Spectral evidence of spinodal decomposition, phase transformation and molecular nitrogen formation in supersaturated TiAlN films upon annealing Original Research Article
Author/Authors :
J.L. Endrino، نويسنده , , C. ?rhammar، نويسنده , , A. Gutiérrez، نويسنده , , R. Gago، نويسنده , , D. Horwat، نويسنده , , L. Soriano، نويسنده , , G. Fox-Rabinovich، نويسنده , , D. Mart?n y Marero، نويسنده , , J. Guo، نويسنده , , J.-E. Rubensson، نويسنده , , J. Andersson، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2011
Pages :
10
From page :
6287
To page :
6296
Abstract :
Thermal treatment of supersaturated Ti1−xAlxN films (x ≈ 0.67) with a dominant ternary cubic-phase were performed in the 700–1000 °C range. Grazing incidence X-ray diffraction (GIXRD) shows that, for annealing temperatures up to 800 °C, the film structure undergoes the formation of coherent cubic AlN (c-AlN) and TiN (c-TiN) nanocrystallites via spinodal decomposition and, at higher temperatures (⩾900 °C), GIXRD shows that the c-AlN phase transforms into the thermodynamically more stable hexagonal AlN (h-AlN). X-ray absorption near-edge structure (XANES) at the Ti K-edge is consistent with spinodal decomposition taking place at 800 °C, while Al K-edge and N K-edge XANES and X-ray emission data show the nucleation of the h-AlN phase at temperatures >800 °C, in agreement with the two-step decomposition process for rock-salt structured TiAlN, which was also supported by X-ray diffraction patterns and first-principle calculations. Further, the resonant inelastic X-ray scattering technique near the N K-edge revealed that N2 is formed as a consequence of the phase transformation process.
Keywords :
X-ray absorption near-edge structure , TiAlN , Resonant inelastic X-ray scattering , Nanocrystalline materials
Journal title :
ACTA Materialia
Serial Year :
2011
Journal title :
ACTA Materialia
Record number :
1145871
Link To Document :
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