• Title of article

    Electronic structure of Mg2Si by combining electron diffraction and first-principles calculations Original Research Article

  • Author/Authors

    K. Valset، نويسنده , , E. Flage-Larsen، نويسنده , , P. Stadelmann، نويسنده , , J. Tafto، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2012
  • Pages
    5
  • From page
    972
  • To page
    976
  • Abstract
    We have used accurate convergent beam electron diffraction to determine the structure factors of the reflections most sensitive to the valence-electron distribution in Mg2Si. The experimental values agree well with calculations of the structure factors based on density functional theory. Based on the experimentally scrutinized electron structure calculations we show that this promising thermoelectric material is highly ionic, arriving at the charge image.
  • Keywords
    Convergent beam electron diffraction (CBED) , Semiconductor , Electronic structure , Density functional
  • Journal title
    ACTA Materialia
  • Serial Year
    2012
  • Journal title
    ACTA Materialia
  • Record number

    1146111