Title of article :
XRD and HREM Studies of Epitaxially Stabilized Hexagonal Orthoferrites RFeO3 (R = Eu-Lu)
Author/Authors :
Bossak، Alexei A. نويسنده , , Graboy، Igor E. نويسنده , , Gorbenko، Oleg Yu. نويسنده , , Kaul، Andrey R. نويسنده , , Kartavtseva، Maria S. نويسنده , , Svetchnikov، Vassily L. نويسنده , , Zandbergen، Henny W. نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2004
Pages :
-1750
From page :
1751
To page :
0
Abstract :
The formation of previously unknown hexagonal modifications of orthoferrites RFeO3 (R = Eu-Lu) was observed on ZrO2(Y2O3) (111) substrates at 900 C. XRD and HREM studies reveal epitaxial growth of the hexagonal film. The structure of the hexagonal RFeO3 was assigned to the ferroelectric space group P63cm. The typical structural defects in the hexagonal RMnO3 films on ZrO2(Y2O3) (111) are described. Parallel deposition on perovskite substrates results in the stable perovskite phase. The epitaxial stabilization concept successfully explains the experimental results.
Journal title :
CHEMISTRY OF MATERIALS
Serial Year :
2004
Journal title :
CHEMISTRY OF MATERIALS
Record number :
115250
Link To Document :
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