Title of article
XRD and HREM Studies of Epitaxially Stabilized Hexagonal Orthoferrites RFeO3 (R = Eu-Lu)
Author/Authors
Bossak، Alexei A. نويسنده , , Graboy، Igor E. نويسنده , , Gorbenko، Oleg Yu. نويسنده , , Kaul، Andrey R. نويسنده , , Kartavtseva، Maria S. نويسنده , , Svetchnikov، Vassily L. نويسنده , , Zandbergen، Henny W. نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2004
Pages
-1750
From page
1751
To page
0
Abstract
The formation of previously unknown hexagonal modifications of orthoferrites RFeO3 (R = Eu-Lu) was observed on ZrO2(Y2O3) (111) substrates at 900 C. XRD and HREM studies reveal epitaxial growth of the hexagonal film. The structure of the hexagonal RFeO3 was assigned to the ferroelectric space group P63cm. The typical structural defects in the hexagonal RMnO3 films on ZrO2(Y2O3) (111) are described. Parallel deposition on perovskite substrates results in the stable perovskite phase. The epitaxial stabilization concept successfully explains the experimental results.
Journal title
CHEMISTRY OF MATERIALS
Serial Year
2004
Journal title
CHEMISTRY OF MATERIALS
Record number
115250
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