Title of article
Ramp rate dependence of E–I characteristics in Bi2223/Ag HTS tapes Original Research Article
Author/Authors
Tsutomu Hemmi، نويسنده , , Takashi Okada، نويسنده , , Akira Ninomiya، نويسنده , , Takeshi Ishigohka، نويسنده , , Kazuaki Arai، نويسنده , , Hiroshi Yamaguchi، نويسنده , , Katsuyuki Kaiho، نويسنده , , Kiyoshi Kurahashi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
5
From page
91
To page
95
Abstract
We have been studying the ramp rate dependence of the E–I characteristics under self-magnetic field in Bi2223/Ag HTS tapes at 77 K. In this paper, we have examined an experimental result and a numerical analysis. Experimentally, we applied about 70 A, which is about twice that of the Ic into Bi2223/Ag HTS tapes at ramp rates of 14 kA/s to 1.4 MA/s. When the ramp rate increases, the electric field of the E–I characteristics increases. The experimental results were compared to that of numerical analysis using finite element method. As a result, when the ramp rate increases, the transport current concentrates to the outer filaments. Therefore, the skin effect occurs for the higher ramp rate, and eddy current loss in Ag sheath increases.
Keywords
HTS tapes , Ramp rate dependence , Finite element method , Skin effect , E–I characteristics
Journal title
Cryogenics
Serial Year
2001
Journal title
Cryogenics
Record number
1172108
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