Title of article :
Measurement of the low temperature electrical properties of solid tantalum capacitors
Author/Authors :
Matthew Trainer، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
4
From page :
285
To page :
288
Abstract :
Highly reproducible capacitance–low temperature and dissipation factor–low temperature curves were obtained for commercial solid tantalum electrolytic capacitors in the range 90–310 K. A description of a design of a cryostat used to test radial wire ended tantalum bead capacitors at low temperatures is given. The tantalum capacitors showed excellent capacitance–temperature linearity between 220 and 310 K for test frequencies of 120 Hz and 1 kHz. Some evidence is given for the presence of dielectric relaxation at ∼210 K.
Keywords :
Thin films , Dielectric properties , Cryostats
Journal title :
Cryogenics
Serial Year :
2001
Journal title :
Cryogenics
Record number :
1172135
Link To Document :
بازگشت