Tl2Ba2CaCu2O8 thin films on 2 in. LaAlO3(0 0 1) substrates Original Research Article

High quality Tl2Ba2CaCu2O8 (Tl-2212) superconducting thin films are prepared on both sides of 2 in. LaAlO3(0 0 1) substrates by off-axis magnetron sputtering and post-annealing process. XRD measurements show that these films possess pure Tl-2212 phase with C-axis perpendicular to the substrate surface. The thickness unhomogeneity of the whole film on the 2 in. wafer is less than 5%. The superconducting transition temperatures Tcs of the films are around 105 K. At zero applied magnetic field, the critical current densities Jcs of the films on both sides of the wafer were measured to be above 2 × 106 A/cm2 at 77 K. The microwave surface resistance Rs of film was as low as 350 μΩ at 10 GHz and 77 K. In order to test the suitability of Tl-2212 thin films for passive microwave devices, 3-pole bandpass filters have been fabricated from double-sided Tl-2212 films on LaAlO3 substrates.