Title of article :
The high temperature oxidation behavior of reaction-bonded silicon carbide
Author/Authors :
Huang Qingwei، نويسنده , , Ma Baodian and Jin Zhihao، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
4
From page :
142
To page :
145
Abstract :
The high-temperature oxidation behavior of reaction-bonded silicon carbide containing 11.5 wt.% free silicon is investigated in air at 1300°C. The experimental results show that the oxidation curve of the material obeys a logarithmic equation due to the crystallization of amorphous silica and cracking of the oxide scale. The room temperature flexural strength of the specimens after oxidizing tends to increase first and then decrease with oxidation time.
Keywords :
Silicon carbide , Reaction bonded , High-temperature oxidation
Journal title :
Journal of Materials Processing Technology
Serial Year :
2001
Journal title :
Journal of Materials Processing Technology
Record number :
1175899
Link To Document :
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