Title of article
The high temperature oxidation behavior of reaction-bonded silicon carbide
Author/Authors
Huang Qingwei، نويسنده , , Ma Baodian and Jin Zhihao، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
4
From page
142
To page
145
Abstract
The high-temperature oxidation behavior of reaction-bonded silicon carbide containing 11.5 wt.% free silicon is investigated in air at 1300°C. The experimental results show that the oxidation curve of the material obeys a logarithmic equation due to the crystallization of amorphous silica and cracking of the oxide scale. The room temperature flexural strength of the specimens after oxidizing tends to increase first and then decrease with oxidation time.
Keywords
Silicon carbide , Reaction bonded , High-temperature oxidation
Journal title
Journal of Materials Processing Technology
Serial Year
2001
Journal title
Journal of Materials Processing Technology
Record number
1175899
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