• Title of article

    The high temperature oxidation behavior of reaction-bonded silicon carbide

  • Author/Authors

    Huang Qingwei، نويسنده , , Ma Baodian and Jin Zhihao، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    4
  • From page
    142
  • To page
    145
  • Abstract
    The high-temperature oxidation behavior of reaction-bonded silicon carbide containing 11.5 wt.% free silicon is investigated in air at 1300°C. The experimental results show that the oxidation curve of the material obeys a logarithmic equation due to the crystallization of amorphous silica and cracking of the oxide scale. The room temperature flexural strength of the specimens after oxidizing tends to increase first and then decrease with oxidation time.
  • Keywords
    Silicon carbide , Reaction bonded , High-temperature oxidation
  • Journal title
    Journal of Materials Processing Technology
  • Serial Year
    2001
  • Journal title
    Journal of Materials Processing Technology
  • Record number

    1175899