Title of article :
Molecular dynamics analysis of self-sharpening phenomenon of thin electrode in single discharge
Author/Authors :
Shoichi Shimada، نويسنده , , Hiroaki Tanaka، نويسنده , , Naotake Mohri، نويسنده , , Hideki Takezawa، نويسنده , , Yoshiro Ito، نويسنده , , Rie Tanabe، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
5
From page :
358
To page :
362
Abstract :
A self-sharpening phenomenon of thin tungsten electrode was found in single discharge under the specified conditions of discharge current and pulse duration. The needle-like sharpening occurs in the period of 100 to 300 μs after the end of discharge when the thin electrode is negative polarity. To understand the mechanism of the self-sharpening phenomenon, molecular dynamics (MD) computer simulation is carried out. MD simulation suggests that the essential conditions for self-sharpening are to exert large radial external force and to produce thin molten layer on electrode surface. The optimum conditions in pulse duration and discharge current exist for self-sharpening depending on the thermal conductivity and size of the electrode.
Keywords :
Self-sharpening , Single discharge , Micro-discharge machining , computer simulation , molecular dynamics
Journal title :
Journal of Materials Processing Technology
Serial Year :
2004
Journal title :
Journal of Materials Processing Technology
Record number :
1178435
Link To Document :
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