Thin film of bis(ethylenedithio)-tetrathiafulvalene radical salt with Dawson polyoxometalate

The thin film of bis(ethylenedithio)-tetrathiafulvalene (BEDT-TTF or ET) radical salt with Dawson polyoxometalate [P2W18O62]6− was prepared on gold substrate by using electrochemical process. The film was characterized by Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), electron spin resonance spectroscopy (ESR) and cyclic voltammetry (CV). Scanning electron microscope (SEM) micrograph of the film exhibits a smooth and uniform surface layer containing micronic grains. The thickness of the film estimated by SEM is ca. 22 μm. The film exhibits semiconducting behavior with a room-temperature conductivity 6.5 × 10−3 S cm−1.