• Title of article

    Estimation of exponential component reliability from uncertain life data in series and parallel systems

  • Author/Authors

    Zhibin Tan، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2007
  • Pages
    8
  • From page
    223
  • To page
    230
  • Abstract
    Estimating reliability of components in series and parallel systems from masking system testing data has been studied. In this paper we take into account a second type of uncertainty: censored lifetime, when system components have constant failure rates. To efficiently estimate failure rates of system components in presence of combined uncertainty, we propose a useful concept for components: equivalent failure and equivalent lifetime. For a component in a system with known status and lifetime, its equivalent failure is defined as its conditional failure probability and its equivalent lifetime is its expectation of lifetime. For various uncertainty scenarios, we derive equivalent failures and test times for individual components in both series and parallel systems. An efficient EM algorithm is formulated to estimate component failure rates. Two numerical examples are presented to illustrate the application of the algorithm.
  • Keywords
    EM theorem , Bayes theorem , Masked data , Equivalent failure and life time , reliability
  • Journal title
    Reliability Engineering and System Safety
  • Serial Year
    2007
  • Journal title
    Reliability Engineering and System Safety
  • Record number

    1187584