• Title of article

    Computation of joint reliability importance of two gate events in a fault tree

  • Author/Authors

    J.S. Hong، نويسنده , , H.Y Koo، نويسنده , , C.H. Lie، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    5
  • From page
    1
  • To page
    5
  • Abstract
    Joint reliability importance (JRI) of two gate events (GEs) is investigated along with its properties in a fault tree (FT). Computation of JRI of two GEs involves complexity because statistical dependency between GEs exists as a result of replication of basic events (BEs). To avoid complexity in computing the JRI, the topological relationships of two GEs in a FT are identified and classified into three classes. The explicit formula for the JRI of the two GEs is derived. JRI for each class is shown to be computed by using a conventional FT algorithm. By illustrating min. cut set representation of the bridge network, it is also shown that the degree of relationship between two min. cut sets can be measured by the JRI of the corresponding two GEs.
  • Keywords
    Fault Tree , Topological relationship , Joint reliability importance , Statistical dependency , Gate event
  • Journal title
    Reliability Engineering and System Safety
  • Serial Year
    2000
  • Journal title
    Reliability Engineering and System Safety
  • Record number

    1188915