• Title of article

    Semi-Markovian reliability models for systems with testable components and general test/outage times

  • Author/Authors

    I.A. Papazoglou، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    13
  • From page
    121
  • To page
    133
  • Abstract
    Semi-Markov models for systems undergoing periodic test and maintenance are developed. In particular, systems undergoing specific changes of state at predetermined instances of time and transiting to states with generally distributed sojourn times are considered. Problems addressed by the models are those concerned with optimum assessment of test intervals, and allowable outage times. Equivalent Markovian models allowing for the decomposition of a system of dimensionality N+M into two smaller problems of dimensionality N and M, respectively are developed. The general model is also specialized to systems with instantaneously testable components, unmonitored components undergoing tests (repair, maintenance) of fixed duration, and systems containing components characterized by limited allowable outage time (under test, or repair). Approximate equivalent Markov models are derived in these cases. Simple numerical examples are also presented.
  • Keywords
    Allowable outage times , Limiting conditions of operation , Surveillance test intervals , Semi-Markov reliability models , Generally tested components
  • Journal title
    Reliability Engineering and System Safety
  • Serial Year
    2000
  • Journal title
    Reliability Engineering and System Safety
  • Record number

    1188927