Author/Authors :
J.V. Dawson، نويسنده , , Robert C. Reeve، نويسنده , , J.R. Wilson، نويسنده , , K. Zuber، نويسنده , , M. Junker، نويسنده , , C. G?ssling، نويسنده , , T. K?ttig، نويسنده , , D. Münstermann، نويسنده , , S. Rajek، نويسنده , , O. Schulz، نويسنده ,
Abstract :
We present 11 independent measurements of the half-life and spectral shape of the 4-fold forbidden beta decay of 113Cd using CdZnTe semiconductors with a total combined lifetime of 6.58 kg days. Our overall result gives a half-life of (8.00±0.11(stat)±0.24(sys))×1015 years and a Q-value of 322.2±0.3(stat)±0.9(sys) keV. For the first time half-lives well beyond 1010 years have been deduced with a statistically representative sample of independent measurements.
Keywords :
Measured , E? , T1/2 , Q-value using CdZnTe detectors in underground laboratory , 113Cd(??) , Radioactivity
