Some aspects of AFM nanomechanical probing of surface polymer films

We analyzed how the approach developed for the microindentation of non-uniform elastic solids can be adapted to analyze the atomic force microscopy (AFM) probing of ultrathin (1–100 nm thick) polymer films on a solid substrate, as well as polymer films with a multilayered structure. We suggested that recent Johnsonʹs modification of the contact mechanics model that included a viscoelastic contribution could also be utilized to analyze rate-dependent loading data for polymer surfaces. The graded model proposed for microindentation experiments was modified allowing to account not only for variable elastic moduli within different layers but also for the gradient of properties between layers within a transition zone. Two examples of a recent application of this model for molecularly thick hyperbranched polymer monolayers (<3 nm thick) and tri-layered polymer films (20–40 nm thick) tethered to a solid substrate were presented and discussed. In both cases, complex shapes of both loading curves and elastic modulus depth profiles obtained from experimental AFM data were successfully fitted by the graded model with realistic structural parameters.