Title of article
INTERFACES AND THIN FILMS AS SEEN BY BOUND ELECTROMAGNETIC WAVES
Author/Authors
Knoll، Wolfgang نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
70
From page
569
To page
638
Abstract
This contribution summarizes the use of plasmon surface polaritons and guided optical waves for the characterization of interfaces and thin organic films. After a short introduction to the theoretical background of evanescentwave optics, examples are given that show how this interfacial “light” can be employed to monitor thin coatings at a solid/air or solid/liquid interface. Examples are given for a very sensitive thickness determination of samples ranging from self-assembled monolayers, to multilayer assemblies prepared by the Langmuir/Blodgett/Kuhn technique or by the alternate polyelectrolyte deposition. These are complemented by the demonstration of the potential of the technique to also monitor time-dependent processes in a kinetic mode. Here, we put an emphasis on the combination set-up of surface plasmon optics with electrochemical techniques, allowing for the online characterization of various surface functionalization strategies, e.g. for (bio-) sensor purposes.
Keywords
evanescent wave optics , guided optical waves , interfacial architectures , ultrathin organic films , plasmon surface polaritons
Journal title
Annual Review of Physical Chemistry
Serial Year
1998
Journal title
Annual Review of Physical Chemistry
Record number
121650
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