Title of article :
Thickness measurement of silicon thin film coated on metal mold by analyzing infrared thermal image
Author/Authors :
Il Seouk Park، نويسنده , , Ji Soo Ha، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
5
From page :
462
To page :
466
Abstract :
An infrared thickness measuring technique for thin film coated on the metal mold was developed and applied to thickness measuring of the artificial breast implant pack. The infrared light emitted from a metal mold itself was partly absorbed to the silicon film, and the remainder of the infrared light was transmitted through the film. The relationship between the thermal image captured by an infrared camera and the film thickness was analyzed. The thicker the film, the bigger the amount absorbed. The new infrared thickness measuring technique agreed well with the results directly measured by a microscope when applied to the artificial breast implant pack.
Keywords :
Non-contact thickness measurement , Artificial breast implant pack , Infrared thermal radiation
Journal title :
International Communications in Heat and Mass Transfer
Serial Year :
2009
Journal title :
International Communications in Heat and Mass Transfer
Record number :
1220498
Link To Document :
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