Title of article :
Characterization of nanoparticles by scattering techniques
Author/Authors :
Chu، Benjamin نويسنده , , Liu، Tianbo نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
Basic principles and applications of different scattering techniques (including static and dynamic light scattering (SLS and DLS), small-angle X-ray scattering (SAXS), wide-angle X-ray diffraction (WAXD) and small-angle neutron scattering (SANS)) on the characterization of nanoparticles are reviewed in this paper. By choosing a suitable scattering technique or a combination of different techniques for nanoparticle characterization, the particles’ molecular weight, radius of gyration, hydrodynamic radius, size distribution, shape and internal structure as well as interparticle interactions of nanoparticles, can be determined. Examples, including some sophisticated colloidal systems, are presented.
Keywords :
nanoscale characterization , Light Scattering , SAXS , WAXD , SANS , Nanoparticle
Journal title :
Journal of Nanoparticle Research
Journal title :
Journal of Nanoparticle Research